Measurement Setups
Complete measurement setups for material testing.
Dielectric materials
- Split post dielectric resonators (SPDR)
- TE01δ mode dielectric resonator
- Fabry-Perot Open Resonator (FPOR)
- Test-fixtures for liquids
Semiconductors
- Split post dielectric resonators (SPDR)
- Single post dielectric resonators (SiPDR)
- Resonators for graphene measurements
- Metals testing
- 2D mapping of dielectrics and high-resistivity semiconductors
- 2D mapping of low resistivity semiconductors and conductive composites
Other
- Material Measurement Suite
- Microwave Q-Meter
- Standard reference materials for QWED's test-fixtures
- Partnership with Rohde & Schwarz
- Awards and Diplomas for Prof. Jerzy Krupka
Resonators
Together, QuickWave software family and Sonnet EM Suite provide a complete set of solutions to address your toughest high frequency problems requiring volume meshing or surface meshing solutions. With its decades of expertise in EM modelling, QWED staff will be pleased to guide customers towards efficient choices of full 3D or planar 3D tools, or combinations thereof, optimised for any specific application.
Split Post Dielectric Resonator (SPDR)
- SPDRs are intended for the measurements of the complex permittivity of laminar dielectric materials including LTCC substrates, but also thin ferroelectric films deposited on low loss dielectric substrates.
Single Post Dielectric Resonator (SiPDR)
- SiPDRs are intended for the measurements of the surface impedance of metamaterials and resistive films as well as for the contact-less measurements of the conductivity of semiconductor wafers. Range of thin film materials that can be measured includes resistive layers, thin metal films and conductive polymer films with the surface resistance Rs < 20 kΩ/square.
TE01δ mode Dielectric Resonator
- TE01δ mode dielectric resonator technique is intended for very precise complex permittivity measurements of bulk low loss disc or cylinder shape dielectric ceramics.
Resonators for graphene measurements
- Investigation of graphene properties has been a hot subject in the world's scientific community for the last couple of years. In October 2010, the interest in the subject was additionally fuelled by the Nobel Prize in Physics awarded jointly to Andre Geim and Konstantin Novoselov "for groundbreaking experiments regarding the two-dimensional material graphene".
- Our expert, Prof. Jerzy Krupka, has developed resonators specifically designed for the measurements of electrical properties of graphene deposited on small 10 mm x 10 mm dielectric substrates at microwave frequencies (around 13 GHz). Such resonators are commercially available through QWED.
Fabry-Perot Open Resonator (FPOR)
- A novel type of a Fabry-Perot Open Resonator (FPOR) with Gaussian mirrors is intended for automated broadband and precise resonant measurements of electromagnetic properties of low-loss dielectric sheets in the 20-110 GHz frequency range. The FPOR system is equipped with a specialized software controlling the measurement process and extracting complex permittivity of the material under test from the measured frequency and quality factor.
2D SPDR Scanner for Material Imaging
- Efficient imaging of material samples with a portable 2D scanner incorporating a 10GHz Split-Post Dielectric Resonator and driven by a low-form-factor vector or scalar network analyser.
Standard reference materials
QWED offers standard reference materials for dielectric measurements. For example, samples of single crystal quartz can be ordered by interested customers, either in conjunction with a resonator purchase or independently. Samples of anisotropic substrates are also available.
Standard reference materials for QWEDs test-fixtures
QWED offers standard reference materials for its measurement test-fixtures. Standard reference materials are available for:
Split-Post Dielectric Resonators
- The SRMs are available for each device type, SPDR 1.1GHz, 2.5GHz, 5GHz, 10GHz, and 15GHz. We offer a single reference material sample or a set of two samples, upon customers choice. The SRMs can be order in conjunction with SPDR device purchase or independently. The SRMs are delivered with a data sheet prepared at QWEDs lab.
TE01 delta cavities
- The SRMs are available for each test-fixture from a standard device line. We offer a single reference material sample, which can be order in conjunction with TE01 delta device purchase or independently. The SRMs are delivered with a data sheet prepared at QWEDs lab.
Detailed information can be requested at pbaczynski@qwed.eu
Award Certificate for Prof. Jerzy Krupka for the invention of Resonators for Precise Measurements of Electromagnetic Properties of Materials at Microwave Frequencies
