Q-choke Split Cylinder Resonator (Q-SCR)
for precise measurements of thin & thick materials
- Q-choke SCR*
- Overcoming sample thickness limitations of known solutions
- Applicable to thin & thick materials (e.g. thin foils, bumper plaques, vacuum windows, 3D printed materials, etc.)
- Q-SCR 10GHz operation parameters:
- Overcoming sample thickness limitations of known solutions
- Dk = 1 - 15
- Df > 10-6
- accuracy:
-
δDk < 0.2%
δDf < 2% - high repeatability:
-
for COP 187µm, Dk=3.347,
→ st. dev.=0.0002 - sample dimensions
-
min 40 x 40 mm
max 100 x 100 mm - thickness:
- Up to 4 mm for low-loss materials (e.g. sapphire)
- Q-SCR 10GHz measurement procedure
- Equipped with dedicated software:
- automating and controlling the measurement
- extracting the dielectric constant (Dk) and dissipation factor (Df) of the material under test
- Two-step measurement procedure:
- resonant frequency and quality factor measured for an empty closed Q-SCR device
- resonant frequency and quality factor measured for a sample-loaded Q-SCR
- measured frequency shift and quality factor change are used to extract Dk and Df
*uncertainty of Dk extraction is due to sample thickness variation
*M. Celuch, M. Olszewska-Placha, L. Nowicki and W. Gwarek, „A Novel Q-Choked Resonator for Microwave Material Measurements Alleviating Sample Thickness Limitations of Existing Techniques,” in IEEE Microwave and Wireless Technology Letters, vol. 34, no. 6, pp. 845-848, June 2024